{"id":2259,"date":"2022-01-28T11:09:13","date_gmt":"2022-01-28T02:09:13","guid":{"rendered":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/?p=2259"},"modified":"2022-01-28T11:15:36","modified_gmt":"2022-01-28T02:15:36","slug":"%e5%8f%b0%e6%b9%be%e5%9b%bd%e9%9a%9b%e3%82%b8%e3%83%a7%e3%82%a4%e3%83%b3%e3%83%88%e3%83%a9%e3%83%9c%e7%a0%94%e7%a9%b6%e6%88%90%e6%9e%9c%e3%81%8c%e9%9b%a3%e9%96%a2%e5%9b%bd%e9%9a%9b%e4%bc%9a%e8%ad%b0ie","status":"publish","type":"post","link":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/news\/2259\/","title":{"rendered":"\u53f0\u6e7e\u56fd\u969b\u30b8\u30e7\u30a4\u30f3\u30c8\u30e9\u30dc\u7814\u7a76\u6210\u679c\u304c\u96e3\u95a2\u56fd\u969b\u4f1a\u8b70IEEE International Electron Device Meeting\u30673\u5e74\u9023\u7d9a\u63a1\u629e"},"content":{"rendered":"\u6771\u5317\u5927\u5b66(\u5bd2\u5ddd\u7814\u7a76\u5ba4)\u3001\u53f0\u6e7e\u56fd\u7acb\u967d\u660e\u4ea4\u901a\u5927\u5b66\u3001\u53f0\u6e7e\u534a\u5c0e\u4f53\u7814\u7a76\u30bb\u30f3\u30bf\u30fc(TSRI)\u306e\u9023\u643a\uff08\u53f0\u6e7e\u56fd\u969b\u30b8\u30e7\u30a4\u30f3\u30c8\u30e9\u30dc\uff09\u306b\u3088\u308b
IGZO\/Si CFET\u306b\u95a2\u3059\u308b\u7814\u7a76\u6210\u679c\u8ad6\u6587\u304c\u56fd\u969b\u4f1a\u8b70IEDM\uff08IEEE International Electron Device Meeting\uff09\u306b\u63a1\u629e\u3055\u308c\u300112\u670815\u65e5\u306b\u767a\u8868\u3092\u884c\u3044\u307e\u3057\u305f\u3002

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\u3010\u767a\u8868\u8ad6\u6587\u3011
S.-W.Chang, T.-H. Lu , C.-Y.Yang, C.-J. Yeh, M.-K. Huang, C.-F. Meng,P.-J. Chen, T.-H. Chang,
Y.-S. Chang,J.- W. Jhu, T.-Z. Hong, C.-C. Ke, X.-R.Yu, W. -H. Lu, M. A. Baig, T.-C. Cho, P.-J. Sung,
C.-J.Su, F.-K. Hsueh, B.-Y. Chen, H.-H. Hu, C.-T. Wu, K.-L. Lin, W. C.-Y. Ma, D.-D. Lu, K.-H. Kao,
Y.-J. Lee, C.-L. Lin, K.-P. Huang, K.- M. Chen, Y. Li, S. Samukawa, T.-S. Chao, G.-W. Huang,
W.-F. Wu, W.-H. Lee, J.-Y. Li, J.-M. Shieh, J.-H. Tarng, Y.-H.Wang, W.-K. Yeh,
\u201cFirst Demonstration of Heterogeneous IGZO\/Si CFET Monolithic 3D Integration with Dual Work function Gate for Ultra Low-power SRAM and RF Applications\u201d,
IEEE 2021 International Electron Device Meeting, 34.4 (Virtual Meeting, 2021\/12\/15).

\"\"
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IEEE IDEM\u30673\u9023\u7d9a\u767a\u8868\u3055\u308c\u305f\u6210\u679c\uff08nanosheet\u3068CFET\uff09\u3092\u307e\u3068\u3081\u3066\u3044\u308b\u3002

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https:\/\/www.ifs.tohoku.ac.jp\/samukawa\/japanese\/index.html<\/a><\/p>","protected":false},"excerpt":{"rendered":"\u6771\u5317\u5927\u5b66(\u5bd2\u5ddd\u7814\u7a76\u5ba4)\u3001\u53f0\u6e7e\u56fd\u7acb\u967d\u660e\u4ea4\u901a\u5927\u5b66\u3001\u53f0\u6e7e\u534a\u5c0e\u4f53\u7814\u7a76\u30bb\u30f3\u30bf\u30fc(TSRI)\u306e\u9023\u643a\uff08\u53f0\u6e7e\u56fd\u969b\u30b8\u30e7\u30a4\u30f3\u30c8\u30e9\u30dc\uff09\u306b\u3088\u308bIGZO\/Si CFET\u306b\u95a2\u3059\u308b\u7814\u7a76\u6210\u679c\u8ad6\u6587\u304c\u56fd\u969b\u4f1a\u8b70IEDM\uff08IEEE International […]","protected":false},"author":1,"featured_media":2264,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[38],"tags":[29],"class_list":["post-2259","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-research","tag-ierc_gnl"],"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/posts\/2259","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/comments?post=2259"}],"version-history":[{"count":1,"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/posts\/2259\/revisions"}],"predecessor-version":[{"id":2261,"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/posts\/2259\/revisions\/2261"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/media\/2264"}],"wp:attachment":[{"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/media?parent=2259"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/categories?post=2259"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.ifs.tohoku.ac.jp\/jpn\/wp-json\/wp\/v2\/tags?post=2259"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}